1 01 13 GessoBologna EDS Spectrum.jpg

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EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC)

Elements Identified Major (> 10%): oxygen, carbon, calcium. Minor (1-10%): NA. Trace (< 1%): silicon.

Area X-ray counts collected: 1,016,168. Live Time: 37.8 seconds. Magnification: 3884x. Analyzed using Oxford X-Max80 energy-dispersive X-Ray spectroscopy (EDS) and Oxford AZtec platform software. Pigment sample was applied to carbon tape and mounted onto aluminum examination stub. X-rays from sample were excited by a 20 kV SEM electron beam in a low vacuum chamber (10 Pascal). The resolution of the X-Max80 silicon drift detector is 123 eV at MnKα wavelength.

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current15:24, 4 January 2017Thumbnail for version as of 15:24, 4 January 20171,460 × 441 (60 KB)MKullman (talk | contribs)EDS Spectrum showing elemental peak height as a function of X-ray counts collected (LC) Elements Identified Major (> 10%): oxygen, carbon, calcium Minor (1-10%): NA Trace (< 1%): silicon Area X-ray counts collected: 1,016,168 Live Time: 37.8 seconds...

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